Multi-wavelength DFB Laser Array in InAs/GaAs Quantum Dot Material Epitaxially Grown on Silicon

Siyuan Yu,Huiyun Liu,Ying Yu,Yi Wang
DOI: https://doi.org/10.1109/iciprm.2019.8819287
2019-01-01
Abstract:We fabricate DFB laser array on 1300nm InAs/GaAs quantum dot (QD) active materials grown on Si substrate. The active region is composed of 7 layers of InAs/InGaAs dots-in-a-well (DWELL) structure separated by 50 nm GaAs spacer layers. Each DWELL layer consists of 3 monolayers of InAs sandwiched between 2 nm lower and 6 nm upper In0.15Ga0.85As layers. Thanks to the strategies developed for realization of high-quality III-V buffers on silicon substrates, good planarity of interfaces and a near defect-free active region are achieved. A good QD uniformity is achieved with a density of 3×101̂0cm2. Due to the QD carrier confinement it is possible to fabricate deep etched ridge waveguide structure with sidewall gratings penetrating the active layer without significant surface recombination problem. The first order grating with a period of 200 nm has aspect ratio of 30:1 and is etched by an opitimised ICP process. By fine tuning the grating period, the lasers in the array cover 6 CWDM wavelengths with channel interval accuracy of 0.2nm, with sie mode suppression ratio of 50 dB. Typical threhsold current density of 550 A/cm2̂ has been achieved.
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