Conductive metallic filaments dominate in hybrid perovskite-based memory devices

Yang Huang,Zhenxuan Zhao,Chen Wang,Hongbo Fan,Yiming Yang,Jiming Bian,Huaqiang Wu
DOI: https://doi.org/10.1007/s40843-019-9433-4
2019-01-01
Science China Materials
Abstract:Organic-inorganic hybrid perovskites (OHPs) are well-known as light-absorbing materials in solar cells and have recently attracted considerable attention for the applications in resistive switching memory. Previous studies have shown that ions can migrate to form a conductive channel in perovskites under an external voltage. However, the exact resistance mechanism for Ag or halogens which dominate the resistive behavior is still controversial. Here, we demonstrate a resistive switching memory device based on Ag/FA 0.83 MA 0.17 Pb(I 0.82 Br 0.18 ) 3 /fluorine doped tin oxide (FTO). The migration of Ag cations and halide anions is demonstrated by energy dispersive X-ray spectroscopy (EDS) after the SET process (positive voltage on Ag). By comparing the I - V behavior of the Au-based devices, it is clear that the conductive channel formed by Ag is the main factor of the switching characteristics for Ag-based devices. Meanwhile, by controlling the appropriate SET voltage, two kinds of resistance characteristics of the analog switch and threshold switch can be realized in the Ag-based device. As a result, it may be possible to implement both data storage and neuromorphic computing in a single device.
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