Abstract:In this paper, a health assessment method for electronic components subject to condition monitoring (CM) is presented, which can be used to estimate the conditional reliability characteristics given the current operational age and the corresponding degradation state. The degradation process is characterized by a continuous-time Markov chain, which is incorporated into a Cox's proportional hazard model to describe the hazard rate of the time to failure. The two main challenges encountered in the health assessment of electronic components subject to CM and hard failure, i.e., the large number of degradation states and the general deteriorating transition mechanism, can be properly addressed by the proposed method. To illustrate the effectiveness of the proposed method, a case study of power metal-oxide-semiconductor field-effect transistors is performed as a representative example of a general electronic application. The method for the model parameter estimation is developed and applied using the degradation and failure data obtained from an accelerated testing experiment, based on which the conditional reliability function, the mean residual life, and other health characteristics can be explicitly calculated using the proposed discretization technique. The excellent accuracy of the health assessment demonstrates the effectiveness and advantages of the proposed method applied to a real electronic component subject to CM and hard failure.

Change-point analysis of the failure mechanisms based on accelerated life tests

Change-point Detection of Failure Mechanism for Electronic Devices Based on Arrhenius Model

Reliability Analysis for Accelerated Life Test Based on Weibull Distribution

Modified information Approach for Detecting Change Points in Piecewise Linear Failure Rate Function

BAYESIAN ANALYSIS OF CONSTANT-STRESS ACCELERATED LIFE TESTING OF WEIBULL DISTRIBUTIONS WITH A CHANGE POINT

A Statistical Method Of Accelerated Life Testing Based On Fuzzy Theory

Health Assessment Method for Electronic Components Subject to Condition Monitoring and Hard Failure

Small-sample Assessment Method for Reliable Life in Equipment Accelerated Life Test

Imprecise Probability Method with the Power-Normal Model for Accelerated Life Testing

Quantile Regression Based Accelerated Life Test Analysis for Problem with Competing Risks of Failure

Analysis Method of Step-Down-stress Accelerated Life Test with Artificial Immune Algorithm

Testing the Existence of Change-Point in NHPP Software Reliability Models.

Designing Adaptive Accelerated Life Tests Using Bayesian Methods

Identifying the Failure Mechanism in Accelerated Life Tests by Two-Parameter Lognormal Distributions

Statistical Analysis of Type-Ii Step-Increasing Data under Step-Stress Accelerated Life Testing of Two-Parameter Weibull Distribution

Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testing

Application of Reliability Growth Model in Step-Down Stress Accelerated Storage Test

Robust Quantile Analysis for Accelerated Life Test Data

Connotation of Failure Mechanism Consistency and Identification Method for Accelerated Testing

Review of multiple-stress models in accelerated life testing

Fiducial Inference-Based Failure Mechanism Consistency Analysis for Accelerated Life and Degradation Tests