Abstract:Degradation tests are powerful and useful tools for lifetime assessment of highly reliable products. In some applications, the degradation measurement process would destroy the physical characteristic of units when tested at higher than usual stress levels of an accelerating variable such as temperature, so that only one measurement can be made on each tested unit during the degradation testing. An accelerated degradation test giving rise to such a degradation data is called an accelerated destructive degradation test (ADDT). The specification of the size of the total sample, the frequency of destructive measurements, the number of measurements at each stress level, and other decision variables are very important to plan and conduct an ADDT efficiently. A wrong choice of these decision variables may not only result in increasing the experimental cost, but may also yield an imprecise estimate of the reliability of the product at the use condition. Motivated by a polymer data, this article deals with the problem of designing an ADDT with a nonlinear model. Under the constraint that the total experimental cost does not exceed a pre-fixed budget, the optimal test plan is obtained by minimizing the asymptotic variance of the estimated 100 p th percentile of the product’s lifetime distribution at the use condition. A sensitivity analysis is also carried out to examine the effects of changes in the decision variables on the precision of the estimator of the 100 p th percentile. A simulation study further shows that the simulated values are quite close to the asymptotic values when the sample sizes are large enough.

Semiparametric evaluation of first‐passage distribution for step‐stress accelerated degradation tests

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process

Planning of step-stress accelerated degradation test based on the inverse Gaussian process

Optimal design for step-stress accelerated degradation testing with competing failure modes

Planning of step-stress accelerated degradation test based on non-stationary gamma process with random effects

Optimal planning of step‐stress accelerated degradation test based on Tweedie exponential dispersion process with random effects

Optimal designs of accelerated degradation tests with random shock failures and measurement errors

Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model

Step-stress accelerated degradation test planning based on Wiener process with correlation

Optimum step-stress accelerated degradation test for Wiener degradation process under constraints

A semiparametric approach for simple step-stress model

Semi-parametric Models for Accelerated Destructive Degradation Test Data Analysis

Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process

Stochastic Modeling and Analysis of Multiple Nonlinear Accelerated Degradation Processes through Information Fusion

Optimal Design for Accelerated Destructive Degradation Tests

Optimal design of constant‐stress accelerated degradation tests based on the Wiener process with manufacturing batches heterogeneity and individual differences

Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

A General Degradation Process of Useful Life Analysis Under Unreliable Signals for Accelerated Degradation Testing

Reliability estimation from two types of accelerated testing considering individual difference and measurement error

Joint Modeling of Linear Degradation and Multiple Dependent Competing Risks Data under a Step-Stress Accelerated Degradation Test