Abstract:Accelerated degradation testing (ADT) is commonly used to obtain degradation data under the hasher than normal usage conditions, and to assess lifetime and reliability for high reliable and long life products in a short time. The optimal design for ADT is to propose the test plan based on the performance degradation process with a reasonable optimal criteria and the constraints of test resources. Both the traditional ADT optimal design and Bayesian ADT optimal design are similar that the historical data is needed to determine the initial values or the prior distributions of the model parameters. However, it may be inaccurate to estimate the parameter values or the prior distributions only according to the historical information, which will result in large deviations between the parameter values or the prior distributions and the actual ones. Therefore, the optimal plan could not meet the statistical accuracy. In this paper, we propose a Bayesian ADT dynamic optimal design method with sequential stress. The degradation information under the most recent stress level will be treated as the prior of the next stress level. Under the assumption of Wiener process, an optimal model with the objective of quadratic loss function is built with the decision variables, e.g. stress levels and inspection times. Finally, the simulation study is introduced to illustrate the proposed method, and the results show that Bayesian ADT optimal design with sequential stress can adjust the test plan dynamically to improve the test efficiency.

Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model

Planning of step-stress accelerated degradation test based on the inverse Gaussian process

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Accelerated Degradation Testing Optimal Design Based on Uncertain Process

Accelerated Degradation Test Planning Using the Inverse Gaussian Process

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process

Optimal Design for Accelerated Degradation Tests with Several Stresses Based on Wiener Process

Planning of Step-Stress Accelerated Degradation Test with Stress Optimization

Optimal Design for Constant-Stress Accelerated Degradation Test Based on Gamma Process

Optimal design for step-stress accelerated degradation testing based on D-optimality

Planning of step-stress accelerated degradation test based on non-stationary gamma process with random effects

A Bayesian Optimal Design for Accelerated Degradation Testing Based on the Inverse Gaussian Process

Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

Optimal design for step-stress accelerated degradation testing with competing failure modes

Bayesian Optimal Design of Sequential Stress Accelerated Degradation Testing

Design of accelerated degradation tests with several stresses based on Wiener process

Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process

Step-stress accelerated degradation test planning based on Wiener process with correlation

Design of Accelerated Degradation Testing with Multiple Stresses Based on D Optimality

Optimal design of constant‐stress accelerated degradation tests based on the Wiener process with manufacturing batches heterogeneity and individual differences

Bayesian Step Stress Accelerated Degradation Testing Design: A Multi-Objective Pareto-optimal Approach.