Operation Behavior Under Extremely High Injection Level for GaN-Based Micron LED

Z.Z. Chen,C.C. Li,F. Jiao,Q.Q. Jiao,J.L. Zhan,Y.B. Tao,S.Y. Wang,X.N. Kang,G.Y. Zhang,B. Shen
DOI: https://doi.org/10.1109/IFWS.2018.8587362
2018-01-01
Abstract:In this work, we have fabricated the different diameter micro pillar <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu$</tex> LEDs with different wavelength and on different substrates. The electroluminescence (EL) spectra and current-voltage (I-V) curves were measured. The high saturate current density was achieved as 300 kA/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> for 20 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu$</tex> UV LED on GaN substrate. Efficiency droop was also improved greatly for <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu$</tex> EDs. Crosslight software was used to simulate the transport and recombination processes under the high injection level. Many-body effect was considered in the integrated quantum drift-diffusion model. The extreme high injection mechanism is discussed.
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