STUDIES OF CuCl/ γ -Al 2 O 3 BY XPS, SSIMS AND ISS

Guo Qinlin,Huang Huizhong,Gui Linlin,Xie Youchang,Tang Youqi
DOI: https://doi.org/10.3866/PKU.WHXB19870411
1987-01-01
Acta Physico-Chimica Sinica
Abstract:The XPS (X-Ray Photoelectron Spectroscopy), SSIMS (Static Second Ion Mass Spectroscopy) and ISS (Ion Scattering Spectroscopy) have shown that CuCl is dispersed on gamma-Al2O3 surface as a monolayer. The maximum amount of dispersion of CuCl on gamma-Al2O3 surface determined by XPS is approaching to the value determined by XRD. The binding energy of Cu2Pa/z obtained by XPS decreases with the amount of CuCl added to the samples. The valence band spectra of CuCl dispersed on gamma-Al2O2 is different from that of pure CuCl, ISS of He+ gave a scattering peak of copper of CuCl/gamma-Al2O3 11 eV higher than that of pure CuCl. They indicate that CuCl has a quite strong interaction with gamma-Al2O3 surface. The dispersed CuCl gave a widening Auger peak which can be attributed to the heterogeneity of gamma-Al2O3 surface.
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