Correction to “synergistic Effect of Ionization and Displacement Damage in NPN Transistors Caused by Protons with Various Energies” [jun 15 1375-1382]

Xingji Li,Chaoming Liu,Jianqun Yang

DOI: https://doi.org/10.1109/tns.2016.2614343

IF: 1.703

2016-01-01

IEEE Transactions on Nuclear Science

Abstract:In the original paper, Fig. 8 contained errors and Fig. 9 was missing. A corrected version of Fig. 8 and Fig. 9 are provided.

What problem does this paper attempt to address?

Correction to “separation of Ionization Traps in NPN Transistors Irradiated by Lower Energy Electrons” [oct 13 3924-3931]

Xingji Li,Chaoming Liu,Jianqun Yang,Yuanchun Zhao,Guangqiao Liu

DOI: https://doi.org/10.1109/tns.2014.2301941

IF: 1.703

2014-01-01

IEEE Transactions on Nuclear Science

Abstract:In the above-named article [ibid., vol. 60, no. 5, pp. 3924-3931, Oct. 2013], Fig. 11 and Fig. 12 were identical. The correct Fig. 11 is provided here.
Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Fang‐Ze Li,Gen-Wen Hsieh,S. H. Dalal,Mary Newton,J.E. Stott,Pritesh Hiralal,Arokia Nathan,P. A. Warburton,Hüsnü Emrah Ünalan,Paul Beecher,Andrew J. Flewitt,Ian Robinson,G.A.J. Amaratunga,W. I. Milne

DOI: https://doi.org/10.1109/ted.2008.2010442

2009-01-01

Abstract:In our paper [F.M. Li et al., 2008], two errors were noticed after the paper went to press. On page 3002, near the middle of the left column, it should say "In this method, zinc oxide and carbon powders are mixed together, usually in a ZnO:C ratio of 1: 1 or 1:4 by weight." In Fig. 8, on page 3005, the x-axis label should say "energy (eV)" instead of "wavelength (eV)." Also, this paper should have been designated as Invited, as it is now above.
Correction: Two-dimensional Polar Metal of a PbTe Monolayer by Electrostatic Doping.

Tao Xu,Jingtong Zhang,Yuquan Zhu,Jie Wang,Takahiro Shimada,Takayuki Kitamura,Tong‐Yi Zhang

DOI: https://doi.org/10.1039/d0nh90052d

2020-01-01

Nanoscale Horizons

Abstract:Correction for ‘Two-dimensional polar metal of a PbTe monolayer by electrostatic doping’ by Tao Xu et al., Nanoscale Horiz., 2020, 5, 1400–1406, DOI: 10.1039/D0NH00188K.
Correction to “improved Low-Voltage-Triggered SCR Structure for RF-ESD Protection” [aug 13 1050-1052]

Fei Ma,Yan Han,Shurong Dong,Meng Miao,Hailiang Liang

DOI: https://doi.org/10.1109/led.2013.2275615

IF: 4.8157

2013-01-01

IEEE Electron Device Letters

Abstract:There is an error in Fig. 1 in the above-named letter [ibid., vol. 34, no. 8, pp. 1050-1052, Aug. 2013]. The corrected figure is published here.
Plasmon-enhanced Luminescence in Novel Complex Conjugated Polymer Nanoparticles: Publisher’s Note

Jiawei Lang,Pengqi Lu,Gang Bi,Chunfeng Cai,Huizhen Wu

DOI: https://doi.org/10.1364/ol.43.000231

2018-01-01

Abstract:This publisher's note corrects errors in the affiliations in Opt. Lett.42, 3789 (2017).OPLEDP0146-959210.1364/OL.42.003789.
Synergistic Effect of Ionization and Displacement Damage in Npn Transistors Caused by Protons with Various Energies

Xingji Li,Chaoming Liu,Jianqun Yang

DOI: https://doi.org/10.1109/tns.2015.2415805

IF: 1.703

2015-01-01

IEEE Transactions on Nuclear Science

Abstract:Based on 2N2222 NPN bipolar junction transistors (BJTs), synergistic effect between ionization and displacement defects induced by 3 MeV, 5 MeV and 10 MeV protons were researched. High-energy protons can be incident upon the silicon (Si) BJTs, producing displacement defects in silicon bulk and ionization damage in the oxide layer of BJTs, respectively. Both ionization and displacement damage result in the degradation of current gain of BJTs. At a given displacement dose, 10 MeV protons induce the maximum degradation of current gain of 2N2222 NPN BJTs, while 3 MeV protons cause the minimum degradation. In this case, non-ionizing energy loss (NIEL) methodology is not suitable to normalize the displacement damage induced by 3 MeV, 5 MeV and 10 MeV protons, which is attributed to the synergistic effect of ionization and displacement damage. The displacement defect centers in based-collector junction of 2N2222 transistor induced by 3 MeV, 5 MeV and 10 MeV proton exposures, were discovered and characterized by deep level transient spectroscopy (DLTS). Based on the comparison between the electrical parameters and the DLTS results, it is shown that, interface traps due to ionization damage induced by high-energy protons spread the emitter-base depletion layer, leading to the enhancement effects to displacement damage in the base-collector junction of NPN BJT. Meanwhile, bias voltage used during DLTS measurement influence characteristics of DLTS signals. With the increasing reverse bias, the value of ΔC/C for VO, V2( = / -), E4 and V2(- /0) + E5 centers increases.
Corrigendum: Comparison of photoresponse of transistors based on graphene-quantum dot hybrids with layered and bulk heterojunctions (2015 Nanotechnology 26 335201)

Yating Zhang,Xiaoxian Song,Ran Wang,Mingxuan Cao,Haiyan Wang,Yongli Che,Xin Ding,Jianquan Yao

DOI: https://doi.org/10.1088/1361-6528/abd436

IF: 3.5

2021-09-29

Nanotechnology

Abstract:The figure 1 from our paper (Nanotechnology, 2015. 26(33): 335201) was wrongly replaced during the process of revising the manuscript. And the corrected figure 1 is as follows.In addition, the supplementary materials should add the citation of our another paper (2015 J. Phys. Chem. C,119(37), 21739)

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
Corrections to “predictive 3-D Modeling of Parasitic Gate Capacitance in Gate-all-Around Cylindrical Silicon Nanowire MOSFETs” [oct 11 3379-3387]

Jibin Zou,Qiumin Xu,Jianjun Luo,Runsheng Wang,Ru Huang,Yangyuan Wang

DOI: https://doi.org/10.1109/ted.2011.2178417

2012-01-01

Abstract:In the above titled paper (ibid., vol. 58, no. 10. pp. 3379-3387, Oct. 2011), there were several typo errors or missing symbols. Corrections are presented here.
Correction: Radiopharmaceutical-activated silicon naphthalocyanine nanoparticles towards tumor photodynamic therapy

Tingting Wang,Jingchao Li,Xun Zhang,Chengao Li,Jiang Ming,Jian Li,Dongsheng Zhang,Jun Yang,Nian Liu,Xinhui Su

DOI: https://doi.org/10.1039/d4cc90284j

2024-08-29

Abstract:Correction for 'Radiopharmaceutical-activated silicon naphthalocyanine nanoparticles towards tumor photodynamic therapy' by Tingting Wang et al., Chem. Commun., 2024, https://doi.org/10.1039/d4cc03281k.
Synergistic Effects of NPN Transistors Caused by Combined Proton Irradiations with Different Energies

Xingji Li,Jianqun Yang,Chaoming Liu,Gang Bai,Wenbo Luo,Pengwei Li

DOI: https://doi.org/10.1016/j.microrel.2018.01.010

IF: 1.6

2018-01-01

Microelectronics Reliability

Abstract:There are a large number of protons with different energies from the dozens of keV to hundreds of MeV in space environment, which simultaneously act on the bipolar junction transistors (BJTs), and induce different irradiation effect and damage defects. Moreover, interaction between displacement defects and ionization defects occurs. In the paper, the interaction mechanisms between oxide charge and displacement defects in 3DG112 NPN BJTs caused by the combined 70 keV and 170 keV protons with 5MeV proton irradiation are studied. Experimental results show the degradation of current gain increases linearly with increasing the irradiation fluence of the 170 keV and 5MeV protons, but increases nonlinearly for the 70 keV protons, implying that the 170 keV and 5MeV protons mainly induce displacement damage on the NPN BJTs, while the 70 keV protons cause ionization damage. It can be seen from the Geant4 calculation that 70 keV and 170 keV protons cause almost the same ionization damage on the 3DG112 transistors, while have significant difference in displacement damage ability, which is favorable to analyze the effect of displacement damage in oxide layer of NPN BJTs induced by 170 keV and 70 keV protons on ionization damage caused by the subsequent 5MeV protons. DLTS analyses show that 5MeV protons produce mainly displacement defect centers in based-collector junction of 3DG112 transistors, and 170 keV and 70 keV protons only induce almost the same number of the oxide trapped charges. While the combined irradiation can produce the more oxide trapped charges, except displacement defects, showing that displacement damage in oxide layer caused by 170 keV and 70 keV protons can increase the oxide trapped charges during the subsequent 5MeV exposures. Moreover, the more displacement defects in oxide layer will induce more oxide trapped charges, and give more enhanced synergistic effects. These results will help to assess the reliability of BJTs in the space radiation environment.
Erratum to: Novel Hybrid Ligands for Passivating PbS Colloidal Quantum Dots to Enhance the Performance of Solar Cells

Yuehua Yang,Baofeng Zhao,Yuping Gao,Han Liu,Yiyao Tian,Donghuan Qin,Hongbin Wu,Wenbo Huang,Lintao Hou

DOI: https://doi.org/10.1007/s40820-015-0078-9

IF: 26.6

2016-01-01

Nano-Micro Letters

Abstract:[This corrects the article DOI: 10.1007/s40820-015-0046-4.].
Correction: Hybrid nanostructures of metal/two-dimensional nanomaterials for plasmon-enhanced applications

Xuanhua Li,Jinmeng Zhu,Bingqing Wei

DOI: https://doi.org/10.1039/c6cs90055k

IF: 46.2

2016-01-01

Chemical Society Reviews

Abstract:Correction for ‘Hybrid nanostructures of metal/two-dimensional nanomaterials for plasmon-enhanced applications’ by Xuanhua Li et al., Chem. Soc. Rev., 2016, 45, 3145–3187.
Publisher Correction: Role of Outer Surface Probes for Regulating Ion Gating of Nanochannels

Xinchun Li,Tianyou Zhai,Pengcheng Gao,Hongli Cheng,Ruizuo Hou,Xiaoding Lou,Fan Xia

DOI: https://doi.org/10.1038/s41467-018-03030-4

IF: 16.6

2018-01-01

Nature Communications

Abstract:The original version of this Article contained an error in Fig. 3. The scale bars in Figs 3c and 3d were incorrectly labelled as 50 μA. In the correct version, the scale bars are labelled as 0.5 μA. This has now been corrected in both the PDF and HTML versions of the Article.
Correction to “Kinetics on Li Deintercalation in Mg- or Li-Doped SiO/Graphite Composite Anodes for Li Ion Batteries: Dopant Effect”

Joonhyeon Kang,Kyunil Rah,Sumin Lee,Se Mi Park

DOI: https://doi.org/10.1021/acs.jpcc.3c07288

2023-11-21

The Journal of Physical Chemistry C

Abstract:[This corrects the article DOI: 10.1021/acs.jpcc.3c05124.].

chemistry, physical,nanoscience & nanotechnology,materials science, multidisciplinary
Erratum to: Piezotronic effect on the luminescence of quantum dots for micro/nano-newton force measurement

Yan Zhang,Jiaheng Nie,Lijie Li

DOI: https://doi.org/10.1007/s12274-018-1998-8

IF: 9.9

2018-01-25

Nano Research

Abstract:The affiliations of the authors in the original version of this article were unfortunately incorrect on the first page and the first page of the ESM.Instead ofYan Zhang1,2, Jiaheng Nie1, and Lijie Li3 (✉)1 School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China2 Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, National Center for Nanoscience and Technology (NCNST), Beijing 100083, China3 Multidisciplinary Nanotechnology Centre, College of Engineering, Swansea University, Swansea SA1 8EN, UKIt should readYan Zhang1,2,3, Jiaheng Nie1, and Lijie Li4 (✉)1 School of Physics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China2 Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing 100083, China3 College of Nanoscience and Technology, University of Chinese Academy of Sciences, Beijing 100049, China4 Multidisciplinary Nanotechnology Centre, College of Engineering, Swansea University, Swansea SA1 8EN, UK

materials science, multidisciplinary,chemistry, physical,physics, applied,nanoscience & nanotechnology
Correction: Copper coordination-based conjugated polymer nanoparticles for synergistic photodynamic and chemodynamic therapy

Qiang Cheng,Yuyan Li,Wei Huang,Ke Li,Minhuan Lan,Benhua Wang,Jianxiu Wang,Xiangzhi Song

DOI: https://doi.org/10.1039/d3cc90149a

IF: 4.9

2023-05-12

Chemical Communications

Abstract:Correction for 'Copper coordination-based conjugated polymer nanoparticles for synergistic photodynamic and chemodynamic therapy' by Qiang Cheng et al. , Chem. Commun. , 2023, https://doi.org/10.1039/d3cc01107k.

chemistry, multidisciplinary
Erratum to “Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing”

Shaohua Pi,Xie Zeng,Nan Zhang,Dengxin Ji

DOI: https://doi.org/10.1109/JPHOT.2016.2550802

IF: 2.4

2016-01-01

IEEE Photonics Journal

Abstract:Presents corrections to figures from the paper, "Dielectric-grating-coupled surface plasmon resonance from the back side of the metal film for ultrasensitive sensing,??? (Pi, S. et al.) IEEE Photon. J., vol. 8, no. 1, Feb. 2016, Art. no. 4800207.
Correction: Bismuth oxyiodide coupled with bismuth nanodots for enhanced photocatalytic bisphenol A degradation: synergistic effects and mechanistic insight

Shunqin Luo,Jinjia Xu,Zijing Li,Chen Liu,Jiawei Chen,Xin Min,Minghao Fang,Zhaohui Huang

DOI: https://doi.org/10.1039/c7nr90222k

IF: 6.7

2017-01-01

Nanoscale

Abstract:Correction for ‘Bismuth oxyiodide coupled with bismuth nanodots for enhanced photocatalytic bisphenol A degradation: synergistic effects and mechanistic insight’ by Shunqin Luo et al., Nanoscale, 2017, DOI: 10.1039/c7nr05320g.
Corrections to "Novel Trench Inner-Spacer Scheme to Eliminate Parasitic Bottom Transistors in Silicon Nanosheet FETs"

Jinsu Jeong,Jun-Sik Yoon,Sanguk Lee,Rock-Hyun Baek

DOI: https://doi.org/10.1109/ted.2024.3394728

IF: 3.1

2024-06-21

IEEE Transactions on Electron Devices

Abstract:In the above article [1], certain parts of Figs. 1 and 3 were either written incorrectly or missing. The proper figures are provided here.

engineering, electrical & electronic,physics, applied
Correction to “‘Clickable’ Organic Electrochemical Transistors”

Roger Hasler,Felice Quartinello,Christoph Lorenz,Gonzalo E. Fenoy,Waldemar A. Marmisollé,O. Azzaroni,P. Bäuerle,W. Knoll

DOI: https://doi.org/10.1021/jacsau.2c00703

IF: 8

2023-01-09

JACS Au

Abstract:[This corrects the article DOI: 10.1021/jacsau.2c00515.].

Correction to “synergistic Effect of Ionization and Displacement Damage in NPN Transistors Caused by Protons with Various Energies” [jun 15 1375-1382]

Correction to “separation of Ionization Traps in NPN Transistors Irradiated by Lower Energy Electrons” [oct 13 3924-3931]

Corrections to “zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [nov 08 3001-3011

Correction: Two-dimensional Polar Metal of a PbTe Monolayer by Electrostatic Doping.

Correction to “improved Low-Voltage-Triggered SCR Structure for RF-ESD Protection” [aug 13 1050-1052]

Plasmon-enhanced Luminescence in Novel Complex Conjugated Polymer Nanoparticles: Publisher’s Note

Synergistic Effect of Ionization and Displacement Damage in Npn Transistors Caused by Protons with Various Energies

Corrigendum: Comparison of photoresponse of transistors based on graphene-quantum dot hybrids with layered and bulk heterojunctions (2015 Nanotechnology 26 335201)

Corrections to “predictive 3-D Modeling of Parasitic Gate Capacitance in Gate-all-Around Cylindrical Silicon Nanowire MOSFETs” [oct 11 3379-3387]

Correction: Radiopharmaceutical-activated silicon naphthalocyanine nanoparticles towards tumor photodynamic therapy

Synergistic Effects of NPN Transistors Caused by Combined Proton Irradiations with Different Energies

Erratum to: Novel Hybrid Ligands for Passivating PbS Colloidal Quantum Dots to Enhance the Performance of Solar Cells

Correction: Hybrid nanostructures of metal/two-dimensional nanomaterials for plasmon-enhanced applications

Publisher Correction: Role of Outer Surface Probes for Regulating Ion Gating of Nanochannels

Correction to “Kinetics on Li Deintercalation in Mg- or Li-Doped SiO/Graphite Composite Anodes for Li Ion Batteries: Dopant Effect”

Erratum to: Piezotronic effect on the luminescence of quantum dots for micro/nano-newton force measurement

Correction: Copper coordination-based conjugated polymer nanoparticles for synergistic photodynamic and chemodynamic therapy

Erratum to “Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing”

Correction: Bismuth oxyiodide coupled with bismuth nanodots for enhanced photocatalytic bisphenol A degradation: synergistic effects and mechanistic insight

Corrections to "Novel Trench Inner-Spacer Scheme to Eliminate Parasitic Bottom Transistors in Silicon Nanosheet FETs"

Correction to “‘Clickable’ Organic Electrochemical Transistors”