Area CCD-Based High Accuracy Measurement Technology and Its Application

Peng-fei HAO,Xin-jun ZHANG,Zhi-guo DONG,Yuan-zong LI
DOI: https://doi.org/10.3969/j.issn.0493-2137.2008.12.010
2008-01-01
Abstract:Aiming at the dimension measurement of image,a new high accuracy measurement technology based on area charge coupled device(CCD)and a measurement method by contrasting images are proposed.The dimension data of meas-ured parts are calculated by contrasting the images of standard parts and measured parts.By using the algorithm of subpixel based on polynomial interpolation and the technology of image contrast,the exact location of edge can be estimated within a pixel.An improved theoretical algorithm of subpixel based on polynomial interpolation is derived.An application sample in industry demonstrates that the maximum bias of the proposed procedure is 0.01 mm.
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