Research on Improvement of Spot Center Location Algorithm by Linear Array CCD Thickness Measurement System

HUANG Jing,XIA Lei,WANG Yi-qiang,WANG You-zhao
DOI: https://doi.org/10.3969/j.issn.1673-3851.2013.04.012
2013-01-01
Abstract:Pixel size of CCD detector and location algorithm of thickness measurement system are important factors influencing the measurement precision of laser thickness measurement system.In allusion to pixel size of CCD detector not easy to change and inadequate precision of the algorithm,this paper puts forward improved algorithm as spot center sub pixel location algorithm based on correlation method and fitting method and applies it in laser thickness measurement system,thus improving the precision of laser thickness measurement.The research result shows that the laser thickness measurement system with improved location algorithm can realize 1 μm measurement precision.
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