Measurement technology of image contrast based on CCD

Pengfei Hao,Wenji Si,Xiaodong Zhang,Yuanzong Li,Lihong Zheng
DOI: https://doi.org/10.1117/12.819703
2008-01-01
Abstract:This paper introduces a new high accuracy measuring method for dimension measurement in industry and a new concept of measurement of image contrast. The new point is to use algorithm of subpixel based on spatial moments and technology of image contrast estimate the exact location of edge within a pixel. The non-linear filter, edge location and subpixel applied in measurement are discussed. More important with the spatial moment and the subdivision technology the accuracy of edge location is improved lots. Real time industrial measure results demonstrates the super advantage of high accuracy dimensional measurement technology be maximum bias within 0.01 mm. Conclusion and discussion are given finally. © 2008 SPIE.
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