X-Ray Spectroscopy Studies on Ni_(100-x)P_x Alloys

宋晋湘,潘志云,姜政,李忠瑞,叶剑,孙治湖,韦正,韦世强
2009-01-01
Abstract:X-ray absorption fine structure(XAFS) and X-ray diffraction(XRD) were utilized to investigate the atomic and electronic structures of Ni100-xPx alloys with different P contents prepared by chemical reduction method.The results show that as x=10,the doped P element leads to expansion and distortion of the Ni fcc lattice in the NiP sample,and the RNi-Ni increases by about 0.03 .With the P content increasing,the expansion and distortion are strengthened.It is found that when x increases to a critical value of 14,the lattice of fcc-Ni is completely destroyed,and the amorphous NiP alloy is formed.The X-ray absorption near edge structure(XANES) results indicate that at a low concentration(x10),no significant change in the electronic structure is observed.However,as P content increases,the distribution of the Ni 4p states becomes more diffuse and broader.When x=26,the white line feature of Ni K-edge implies that a large number of charges are transferred from Ni atoms to P atoms.
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