Investigation of Oxygen Precipitation Behavior in Nitrogen-doped Czochralski Silicon Used for Solar Cells

LI Yong,ZHONG Yao,XI Zhen-qiang,YANG De-ren,QUE Duan-lin
DOI: https://doi.org/10.3969/j.issn.1673-2812.2006.05.011
2006-01-01
Abstract:The behavior of oxygen precipitates in NCZ silicon during the simulated solar cell thermal process was studied by Fourier Transformation Infrared Ray(FTIR).It was found that the concentration of as grown oxygen precipitates in NCZ silicon was slightly higher than that of CZ silicon,which suggested that nitrogen could enhance oxygen precipitation during the crystal growth.However, no oxygen precipitates were generated both in NCZ silicon and CZ silicon during the simulated solar cell thermal process,indicating that nitrogen would not affect oxygen precipitates in the short-time process.
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