Thermal Resistance Measurement of Light-Emitting Diodes Based on Photo-Electro-thermal Theory
CHENG Xing-fu,LIU Xian-ming,CHEN Wei-min,LAI Wei
DOI: https://doi.org/10.16136/j.joel.2014.10.046
2014-01-01
Abstract:Thermal characteristics of light emitting diode(LED)devices directly affect their performance,such as luminous efficiency,emission wavelength,reliability,and lifetime.Thermal resistance is a comprehensive parameter reflecting the heat transfer capability of the device,so it is particularly important to accurately measure the thermal resistance.In this paper,relationships between thermal resistance and luminous flux and electrical power are simplified based on the photo-electro-thermal theory,in which the photometric,electrical,and thermal features of LEDs are highly dependent on one another.A new method using the optical,electrical and temperature characteristics of the LED is proposed to measure the thermal resistance.The calculation of thermal resistance of the LED utilizes the reduction rate of luminous efficacy with the increasing temperature ke,heat dissipation coefficient kh,heat sink temperature Ths and the electric power corresponding to the maximum luminous flux P*d.The procedures how to determine the above parameters are introduced.Then,the thermal resistances of different types of LED devices are measured.Results show that the measured thermal resistances are highly consistent with the nominal values,which confirms the feasibility and generality of the proposed method.This method is simple and credible,and requires no expensive thermal measuring instruments,making it valuable for engineering application.