A 600V High-side Gate Drive Circuit with Ultra-low Propagation Delay for Enhancement Mode GaN Devices

Yangyang Lu,Jing Zhu,Weifeng Sun,Yunwu Zhang,Kongsheng Hu,Zhicheng Yu,Jing Leng,Shikang Cheng,Sen Zhang
DOI: https://doi.org/10.1109/ispsd.2018.8393607
2018-01-01
Abstract:Benefit from the presented new Common Mode Dual-Interlock (CMDI) structure, a 600V high-side gate driver base on norma 0.5μm 600V Bipolar-CMOS-DMOS (BCD) technology achieving the high dV S /dt noise immunity larger than 85V/ns and low propagation delay less than 22ns for enhancement mode gallium nitride (GaN) devices is proposed in this paper.
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