Atomic Structures of Ruddlesden-Popper Faults in LaCoO 3 /srruo 3 Multilayer Thin Films Induced by Epitaxial Strain

Wei Wang,Hui Zhang,Xi Shen,Xiangxiang Guan,Yuan Yao,Yanguo Wang,Jirong Sun,Richeng Yu
DOI: https://doi.org/10.1016/j.jcrysgro.2018.03.029
IF: 1.8
2018-01-01
Journal of Crystal Growth
Abstract:In this paper, scanning transmission electron microscopy is used to study the microstructures of the defects in LaCoO3/SrRuO3 multilayer films grown on the SrTiO3 substrates, and these films have different thickness of SrRuO3 (SRO) layers. Several types of Ruddlesden-Popper (R.P.) faults at an atomic level are found, and these chemical composition fluctuations in the growth process are induced by strain fields originating from the film-film and film-substrate lattice mismatches. Furthermore, we propose four types of structural models based on the atomic arrangements of the R.P. planar faults, which severely affect the functional properties of the films.
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