Interface Thickness Optimization of Lead-Free Oxide Multilayer Capacitors for High-Performance Energy Storage

Zixiong Sun,Linxi Wang,Ming Liu,Chunrui Ma,Zhongshuai Liang,Qiaolan Fan,Lu,Xiaojie Lou,Hong Wang,Chun-Lin Jia
DOI: https://doi.org/10.1039/c7ta10271b
IF: 11.9
2018-01-01
Journal of Materials Chemistry A
Abstract:The effects of interface density and total multilayer film thickness on the dielectric properties and breakdown behavior have been revealed in this work by investigating the environment-friendly energy storage multilayer films of Ba0.7Ca0.3TiO3 (BCT) and BaZr0.2Ti0.8O3 (BZT) dielectrics. Numerical simulations based on a finite element method have given the breakdown process vividly, which agreed well with the experimental results. Moreover, not only the ultrahigh energy storage density of 51.8 J cm−3 with a great efficiency of 81.2% at room temperature but also robust thermal stability has been obtained by optimizing the interface density and total thickness. High energy density above 25.1 J cm−3 and excellent efficiency over 63.6% from room temperature to 200 °C provide a solid basis for potential applications of the multilayer systems in harsh environments.
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