Effects of Vacuum Annealing on Optical and Microstructure Properties of Zinc Sulfide Thin Film

LIU Hua-song,JIANG Cheng-hui,LI Shi-da,YANG Xiao,JI Yi-qin,ZHANG Feng,CHEN De-ying
DOI: https://doi.org/10.3788/ope.20172508.2038
2017-01-01
Optics and Precision Engineering
Abstract:The effect of vacuum annealing on the optical and microstructural properties of zinc sulfide (ZnS) thin films deposited by ion beam evaporation (below 550 ℃) was investigated.The analysis of optical and microstructure characteristics of the thin films show that, the microstructure of ZnS films is cubic-like structure, and has a critical characteristic turning point at a wavelength of 337.5 nm.With the increase of annealing temperature, the variation trend of the extinction coefficient on both sides of the critical wavelength is opposite.The refractive index and physical thickness decreases while the band gap of the film gradually increases.The effect of annealing temperature on the refractive index of ZnS films is slight in the near infrared, and the transition of the extinction coefficient at 350 ℃ is mainly due to the smaller tendency of the grain size.The metallographic analysis indicates that the ZnS films are transformed from cubic-like structure to hexagonal structure, which was consistent with the trend of band gap of the ZnS films.Therefore, the change of the optical properties of the thin film is lead by the microstructure variation of thin films.
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