Investigation of reflective performance for micro-pyramid arrays by roll-to-roll UV imprinting process

Hao Wu,Jie Gao,Peiyun Yi,Linfa Peng,Xinmin Lai
DOI: https://doi.org/10.1016/j.mee.2017.09.004
IF: 2.3
2017-01-01
Microelectronic Engineering
Abstract:In recent years, devices with reflective performance have been broadly applied in many aspects of our lives such as flexible displays, e-paper, greenhouse temperature control, warning signs and so on. There are many reflective structures, and micro-pyramid, due to its merits of outstanding reflective performance (theoretically up to 66.7%) is an excellent choice and can be effectively fabricated via roll-to-roll (R2R) Ultra Violet (UV) imprinting process. However, possessing the properties of high depth-to-width ratio and sharp edges, micro-pyramid arrays are hard to make without some defects such as volume shrinkage and bubble defects during R2R process. This paper aims to explore the relationship between these defects and reflective performance. At first, the optical thin film with micro-pyramid arrays was fabricated, then the investigation of the relationship was carried out and a novel assessment criterion (equivalent radium,Re) is proposed to roughly characterize the negative relationship between structural defects and reflective performance. Meanwhile, the effects of substrate thickness and different processing methods on reflective performance have also been investigated. The relationship between reflective performance and substrate thickness exhibits periodicity, thus providing the instructions about the large-scale production of reflective films.
What problem does this paper attempt to address?