Abstract:Scan based built-in self-test (BIST), which naturally extends scan-based test methodology with test patterns applied from test equipment to BIST, can be used for the self test of sequential circuits and attain higher fault coverage. If the circuit under test (CUT) contains multiple parallel scan chains, a parallel generator is needed. Known as the common pseudo-random pattern generator (PRPG), an LFSR can be configured to generate a random pattern stream. The PRPG-based patterns may be applied to the existing scan architecture directly from the LFSR, or through some decorrelation logic. In order to attain higher fault coverage, it is very important to analyze the test pattern generation in the scan based BIST. The paper presents a kind of scheme for test pattern generation in the scan based BIST for the circuits with multiple scan chains. In the test pattern generation scheme the PRPG, which is implemented by an LFSR, shifts the sequences into all scan chains simultaneously. The correlativity weight R(M) of multiple scan chains is also defined in the paper. Based on the analysis of the different degree effect on fault coverage due to the different configuration of multiple scan chains, one conclusion is drawn that the probability that the fault coverage is reduced is increased with an increase of the correlativity weight R(M). If the circuit is tested by the multiple scan chains with the minimum R(M), the probability that the fault coverage is reduced is least. In the paper a method to construct multiple scan chains with minimum correlativity weight R(M) is proposed to overcome the bad effect on fault coverage due to the correlation between scan chains. Furthermore the minimum set of deterministic patterns is generated for hard-to-test faults by ATPG and the set is used to design the bit modifying logic circuit (BML), which is located between multiple scan chains and the CUT. Through BML the signals in multiple scan chains are controlled to input to the CUT. When the test control signal is low, the test patterns in multiple scan chains are input into the CUT directly. When the test control signal is high, the value of the signals at certain bit positions in the multiple scan chains are modified by BML and the changed test patterns are input into the CUT to test hard-to-test faults for complete fault coverage. The experiments on some ISCAS'89 benchmark circuits show that the complete fault coverage can be obtained by the test method presented by the paper. The overhead of BML is also analyzed.

A D-M Chaotic Model Atpg in Mixed Circuits Bist

ATPG of Digital Electronic Systems BIST Based on D-PL Chaotic Model

The Construction of D-M Chaos Model and Its Application in Mixed Circuits Testing

BIST Technique of Digital Circuits Based on Improved Tent Chaotic Sequence

An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

BIST Technique of Sequential Circuits Based on Chaotic Sequence

A New Method to Extract Gate Bias-Dependent Parasitic Resistances in GaAs Phemts

Extraction and optimization of analog circuit built-in self test fault features

ATPG for Digital Circuits with Memory Chips

Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing

A Testability Research of Board-level Mixed Circuit Based on BIST

Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains

A RANDOM SEQUENCE GENERATOR BASED ON CHAOTIC CIRCUITS

A Low Power Test Pattern Generation for Built-in Self-Test Based Circuits

The Appliance of Duffing Chaotic Detection System in Displacement Measurement of Capacitance Sensor

A Low Power Test Pattern Generation Method

A Test Pattern Selection Method for Dynamic Burn-In of Logic Circuits Based on Atpg Technique

A Test Generation Approach For Non-Synchronous Sequential Circuit

A Low Cost Test Pattern Generator for Test-Per-clock BIST Scheme.

Efficient Circuit Structure Analysis for Automatic Behavioral Model Generation in Mixed-Signal System Simulation

Circuit design and application for weak signal detection based on Duffing oscillator