The Construction of D-M Chaos Model and Its Application in Mixed Circuits Testing
Min Zhu,Tang Cui,Xihan Qi
DOI: https://doi.org/10.1109/IPEC57296.2023.00046
2023-01-01
Abstract:In order to seek a universal and simple test method to realize the embedded test of digital-analog mixed circuits, a new method based on D-M chaos model is proposed in this paper. First, starting with the characteristics of time series generated from a chaos model, the possible influence on the test results is analyzed. The D-M model not only has the characteristics of the discrete Tent (D-Tent) model, but also has a wide spectrum of signal sequences, and its correlation is small and close to the white noise. And then the model parameters are selected to generate the chaotic time series with optimal characteristics. Second, the test sequences of the analog circuit are constructed by the chaotic time series, and the simulation is carried out to load the vectors to the analog circuit, and the fault features of the output are analyzed. Finally, FPGA is adopted as an embedded controller of digital-analog mixed circuit tested object to validate the method. The results show that this proposed method can effectively identify the fault in digital-analog mixed circuits, and it has a great reference value to mixed circuit testing.