Natural-superlattice Structured CaBi2Nb2O9-Bi4Ti3O12 Ferroelectric Thin Films

Caihong Xue,Xin Sun,Yunxiang Zhang,Yuyao Zhao,Hanfei Zhu,Qian Yang,Menglin Liu,Chunming Wang,Jun Ouyang
DOI: https://doi.org/10.1016/j.ceramint.2017.03.197
IF: 5.532
2017-01-01
Ceramics International
Abstract:Natural-superlattice-structured/intergrowth CaBi2Nb2O9-Bi4Ti3O12 (CBNO-BIT) ferroelectric thin films were successfully prepared via a magnetron sputtering process. XRD and TEM analysis revealed the [Bi2O2-(CaNb2O7)-Bi2O2-(Bi2Ti3O10)]n intergrowth structure of the film, as well as a (200)/(020) texture. XPS and EDS results confirmed that the film composition is close to the chemical stoichiometry. With its microstructure being successfully tailored at the nanoscale, the CBNO-BIT film exhibits good electrical properties, including a large dielectric constant (εr ∼390), a high piezoelectric coefficient (d33 ∼90pm/V) as well as a high energy storage density (WE ∼76J/cm3). Finally, the intergrowth nature of the film was verified by the measured temperature-dependent dielectric response (C-T).
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