Deep-etched III-V Lasers Grown Directly on Silicon Substrates

Samuel Shutts,Stella N. Elliott,Peter M. Smowton,Angela Sobieserski,Jiang Wu,Siming Chen,Qi Jiang,Mingchu Tang,Huiyun Liu
DOI: https://doi.org/10.1109/ipcon.2016.7831218
2016-01-01
Abstract:We investigate factors affecting device performance of deep-etched InAs/GaAs quantum-dot ridge-lasers grown directly on silicon substrates, emitting close to 1.3-μm. Continuous-wave reliability measurements show there is a significant reduction in degradation, in terms of threshold current and slope efficiency, as the cavity length is increased.
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