Abstract:Journal Article Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures Get access M I Nandasiri, M I Nandasiri Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar N Madaan, N Madaan Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar A Devaraj, A Devaraj Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar J Bao, J Bao Computational Material Sciences, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar Z Xu, Z Xu Computational Material Sciences, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar T Varga, T Varga Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar V Shutthanandan, V Shutthanandan Environmental and Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland WA, 99354 Search for other works by this author on: Oxford Academic Google Scholar S Thevuthasan S Thevuthasan Qatar Environment and Energy Research Institute, Qatar Foundation, Doha, Qatar Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 845–846, https://doi.org/10.1017/S1431927615005024 Published: 23 September 2015

Single Atom Imaging and Spectroscopy of Impurities in 2D Materials

In Situ High Temperature Atomic Resolution Transmission Electron Microscopy of 2D Nanomaterials

Direct Imaging of Low-Dimensional Nanostructures

Imaging interstitial atoms with multislice electron ptychography

Atomic resolution liquid-cell transmission electron microscopy investigations of the dynamics of nanoparticles in ultrathin liquids.

Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy

Individual Mo Dopant Atoms in WS2 Monolayers: Atomic Structure and Induced Strain

Ultrafast Probes of Electron–hole Transitions Between Two Atomic Layers

Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Diffraction imaging of organic materials in extreme environments

In-Situ S/TEM Probing of the Behavior of Nanoparticles under Chemical and Electrochemical Reactions in the System Involving Solid, Liquid and Gas

Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Back Cover: Hidden Impurities Generate False Positives in Single AtomCatalyst Imaging

Ptychographic Single Particle Analysis for Biological Science

Subsurface Particle Analysis Using X-ray Computed Tomography and Confocal Xray Fluorescence

Picometer-precision few-tilt ptychotomography of 2D materials

Microscopy-Based Approaches to Characterizing Analogs of Classical Electrons in Colloidal Crystals Engineered with DNA

Impurity atom configurations in diamond and their visibility via scanning transmission electron microscopy imaging

Imaging Individual Molecules Using Liquid-phase TEM - Surprises and Research Opportunities

Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution