Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Ping Lu,Lin Zhou,Jon Ihlefeld,Wei Pan
DOI: https://doi.org/10.1017/s143192761800082x
IF: 4.0991
2018-01-01
Microscopy and Microanalysis
Abstract:Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy - Volume 24 Issue S1
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