Subsurface Particle Analysis Using X-ray Computed Tomography and Confocal Xray Fluorescence

Nikolaus L. Cordes,Srivatsan Seshadri,George J. Havrilla,Brian M. Patterson,Michael Feser,Xiaoli Yuan,Ying Gu,Deming Wang
DOI: https://doi.org/10.1017/s1431927614005613
IF: 4.0991
2014-01-01
Microscopy and Microanalysis
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