Low-loss and Low-Crosstalk Si Etched Diffraction Gratings with Multi-Point Iterative Optimization

Tong Ye,Tao Chu
DOI: https://doi.org/10.1109/group4.2016.7739089
2016-01-01
Abstract:Low-insertion loss and low-crosstalk silicon etched diffraction gratings (EDGs) with a multi-point iterative optimization were demonstrated. By using CMOS 180 nm fabrication processing, high performance EDGs with an insertion loss of approximately 1.0-1.5 dB and crosstalk below -30 dB were implemented.
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