Solution-Processed High-K Magnesium Oxide Dielectrics For Low-Voltage Oxide Thin-Film Transistors

Guixia Jiang,Ao Liu,Guoxia Liu,Chundan Zhu,You Meng,Byoung-Chul Shin,Elvira Fortunato,Rodrigo Martins,Fukai Shan
DOI: https://doi.org/10.1063/1.4966897
IF: 4
2016-01-01
Applied Physics Letters
Abstract:Solution-processed metal-oxide thin films with high dielectric constants (k) have been extensively studied for low-cost and high-performance thin-film transistors (TFTs). In this report, MgO dielectric films were fabricated using the spin-coating method. The MgO dielectric films annealed at various temperatures (300, 400, 500, and 600 degrees C) were characterized by using thermogravimetric analysis, optical spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and atomic-force microscopy. The electrical measurements indicate that the insulating properties of MgO thin films are improved with an increase in annealing temperature. In order to clarify the potential application of MgO thin films as gate dielectrics in TFTs, solution-derived In2O3 channel layers were separately fabricated on various MgO dielectric layers. The optimized In2O3/MgO TFT exhibited an electron mobility of 5.48 cm(2)/V s, an on/off current ratio of 10 7, and a subthreshold swing of 0.33 V/dec at a low operation voltage of 6V. This work represents a great step toward the development of portable and low-power consumption electronics. Published by AIP Publishing.
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