Displacement Damage in Bipolar Junction Transistors: Beyond Messenger-Spratt

Hugh J. Barnaby,Ronald D. Schrimpf,K.F. Galloway,Xingji Li,Jianqun Yang,Chaoming Liu
DOI: https://doi.org/10.1109/TNS.2016.2615628
IF: 1.703
2017-01-01
IEEE Transactions on Nuclear Science
Abstract:Bipolar junction transistors (BJTs) with relatively large feature sizes, typical of older technologies and high-voltage devices, are susceptible to recombination in the neutral base region when they are damaged by atomic displacement. This results in gain degradation, which, as originally described by Messenger and Spratt, can be modeled as an increase in the ratio of BJT base to collector current...
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