Study of the Relation Between the Surface Loss and the Field Flatness in the Eid

Yong Yin,Bin Wang,Hailong Li,Lin Meng
DOI: https://doi.org/10.1080/00207217.2016.1196748
2017-01-01
International Journal of Electronics
Abstract:The relationship between surface loss and field flatness in extended interaction device (EID) has been studied. The field flatness can influence the surface loss in the circuit and hence the efficiency of the device without changing the operation mode. A W-band nine-slot extended interaction circuit operating in the 2 mode has been used in this article. As an oscillator, the nine-slot interaction circuit has different surface loss regions when the field flatness is different. In the study of EID, the operation point is mainly determined by the slow wave structure, but the field flatness should also be studied carefully for it influences the surface loss in the circuit and hence the efficiency of the device.
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