In situ study on transport property of bending GaAs nanowires in transmission electron microscope

Pan GAO,Jiangjing WANG,Xiaodong WANG,Zhiming LIAO,Ruiwen SHAO,Kun ZHENG,Xiaodong HAN,Ze ZHANG
DOI: https://doi.org/10.3969/j.issn.1000-6281.2015.02.002
2015-01-01
Abstract:In a transmission electron microscope, in?situ deformation process and measurement of electrical transport properties were performed on individual GaAs nanowires. The single GaAs nanowire was selected and bonded between two tungsten pinpoints with assistance of piezo system and electron?beam induced deposition technique. By controlling the movable tungsten pinpoint, bending process of the bonded nanowire and the corresponding current?voltage curves were obtained simultaneously. Strain distributions analyzed using finite element analysis method indicate that the GaAa nanowire was mostly under compressive strain when it’ s both ends were restrained. The conductivity was only enhanced about 55% with increasing deformation which may be attributed to co?existence of tension and compression in the bended GaAs nanowires.
What problem does this paper attempt to address?