Development of Analysis Technology for Surface Composition and Microstructure of Nanometer TiO2

施长年,陈志春,薛兴涛,吕德水,林贤福
DOI: https://doi.org/10.3321/j.issn:1005-023x.2002.05.013
2002-01-01
Abstract:The latest developments of methods for analyzing composition and microstructure of surface of nanometer TiO2 are introduced.Photoelectric spectroscopy techniques including XPS and AES,spectral analysis techniques including IR Raman,microspectroscopy analysis method including STM.AFM SEM and TEM,and x-ray analysis technology are described in this paper.
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