Abstract:It is common practice to describe the coordination of metal atoms in a binding configuration with their nearest neighbors in terms of oxidation state, a measure by which the number of electrons redistributed between atoms forming chemical bonds. In XPS terms, change to an oxidation state is commonly inferred by correlating photoemission signal with binding energy. The assumption, when classifying photoemission signals into distinct spectral shapes, is that a distribution of intensities shifted to lower binding energy is evidence of a reduction in oxidation state. In this Insight note, we raise the prospect that changes in photoemission peak shape may occur without obvious changes, determined by XPS in stoichiometry for a material. It is well known that TiO 2 measured by XPS yields reproducible Ti 2p photoemission peaks. However, on exposing TiO 2 to ion beams, Ti 2p photoemission evolves to complex distributions in intensity, which are particularly difficult to analyze by traditional fitting of bell‐shaped curves to these data. For these reasons, in this Insight note, a thin film of TiO 2 deposited on a silicon substrate is chosen for analysis by XPS and linear algebraic techniques. Alterations in spectral shapes created from modified TiO 2 , which might be interpreted as the change in oxidation state, are assessed in terms of relative proportions of titanium to oxygen. It is found through detailed analysis of spectra that quantification by XPS, using procedures routinely used in practice, is not in accord with the typical interpretations of photoemission shapes. The data processing methods used and results presented in this work are of particular relevance to elucidating fundamental phenomena governing the surface evolution of materials‐enabled energy processes where cyclic/non‐steady usage changes the nature of bonding, especially in the presence of contaminants.

Towards an atomic-scale understanding of oxide film in the Ti powder surface

Characterization of the Surface Oxygen-Diffusion Zone of the Thermally Oxidized Titanium

Microstructure Optimization and Optical and Interfacial Properties Modulation of Sputtering-Derived Hfo2 Thin Films by Tio2 Incorporation

Size Dependent Phase Transformation in Atomized TiAl Powders

Investigation of microstructure evolution in Pt-doped TiO2 thin films deposited by rf magnetron sputtering

Investigation of surface morphology, structure and electrocatalytic properties for O2 evolution of titanium based IrO2+Ta2O5 coatings

Compositional and Structural Evolution of the Titanium Dioxide Formation by Thermal Oxidation

Atomic-scale Structure and Electronic Property of the LaAlO3/TiO2 Interface

Atomic-Scale Modeling of the Dynamics of Titanium Oxidation

Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films

Unveiling the Atomic Structures of the Minority Surfaces of TiO2 Nanocrystals

Insight into the effect of oxygen vacancies and OH groups on anatase TiO2 for CO oxidation: A combined FT-IR and density functional theory study

A Study of Titanium Oxide Film Electrodes Prepared by Direct Thermal Oxidation Ⅰ. Preparation, Structure and Electrochemical Properties

Modeling the aqueous interface of amorphous TiO2 using deep potential molecular dynamics

The atomic structural descriptor based on cluster expansion method and superior performance of oxygen reduction on PtTi surface alloys from theoretical perspective

Experimentally informed structure optimization of amorphous TiO2 films grown by atomic layer deposition

Deciphering phase evolution in complex metal oxide thin films via high-throughput materials synthesis and characterization

Development of Analysis Technology for Surface Composition and Microstructure of Nanometer TiO2

The Atomic and Electronic Structure of the TiO2- and BaO-terminated BaTiO3(001) Surfaces in a Paraelectric Phase

Effects of oxygen adsorption on the corrosion behavior of the Ti(0001) surface: a DFT investigation

Influence of Ti Content on the Partial Oxidation of TixFeCoNi Thin Films in Vacuum Annealing.