Photon Flux Measurement of the Soft X - Ray Beamline in Hefei Light Source

张玉煙,徐师国,蒋诗平,张新夷,魏道严
DOI: https://doi.org/10.3321/j.issn:0253-3219.2001.07.001
2001-01-01
Nuclear Techniques
Abstract:The relationship between the photon flux and the wave length of the soft X - ray beamline in Hefei Light Source (HLS) was calculated. The photocurrent was measured by an AXUV photo diode when a condense zone plate of CZP32 type and a pinhole of 30 microns were adopted by the monochromator. Accoding to the photocurrent and the quantum efficiency of the diode, the absolute photon flux outside the vacuum separation window in a range of 2. 8 nm to 3. 9 nm was measured to be 2. 7 ×105-8. 0 ×105 photons/(s. mA·0. 1nmBW). By theoretical calculation, It was found that the photon flux inside the vacuum chamber was about 107 photons(s·mA·0. 1nmBW), which was two orders higher than the value outside.
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