Time Delay Estimation and Data Analysis of Parallel Interconnect Lines in High Speed Circuits

李长辉,毛军发,李晓春
DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.06.012
2004-01-01
Abstract:The worst-case time delay of two and three parallel interconnect lines in 0.25 μm technology is estimated using numerical analysis, and simple empirical formulas for time delay have been derived, which take into account both the drive resistance and load capacitance. These expressions have a wider range of applications than formulas used in literatures. And the calculated results are close to those from Hspice simulation.
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