SPUTTERING MODE TRANSITION OF MgO THIN FILM CHARACTERIZED BY SURFACE FRACTAL

Y Wang,KW Xu
DOI: https://doi.org/10.3321/j.issn:0412-1961.2003.10.008
IF: 1.797
2003-01-01
ACTA METALLURGICA SINICA
Abstract:MgO thin films were prepared by reactive magnetron sputtering with Mg as a target and O-2 as reactive gas, and characterized by atomic force microscopy (AFM). The method of Fourier transformation was used to calculate the fractal dimension of AFM images. The relationship between fractal dimension and sputtering mode was explored. The results show that the calculated fractal dimension D-fc of the film prepared at oxygen partial pressure of 30% is a critical value, corresponding to transition of sputtering mode. The sputtering modes are closely related to metallic and oxide modes respectively when their fractal dimension values are far beyond critical D-fc.
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