Abstract:Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, relatively slow acquisition, and damage in beam-sensitive samples, still limit the quantity and quality of interpretable data that can be obtained. To mitigate these issues, here we propose a method based on the subsampling of probe positions and subsequent reconstruction of an incomplete dataset. The missing probe locations (or pixels in the image) are recovered via an inpainting process using a dictionary-learning based method called beta-process factor analysis (BPFA). To investigate the robustness of both our inpainting method and Hough-based indexing, we simulate subsampled and noisy EBSD datasets from a real fully sampled Ni-superalloy dataset for different subsampling ratios of probe positions using both Gaussian and Poisson noise models. We find that zero solution pixel detection (inpainting un-indexed pixels) enables higher quality reconstructions to be obtained. Numerical tests confirm high quality reconstruction of band contrast and inverse pole figure maps from only 10% of the probe positions, with the potential to reduce this to 5% if only inverse pole figure maps are needed. These results show the potential application of this method in EBSD, allowing for faster analysis and extending the use of this technique to beam sensitive materials.

METALLOGRAPHIC SAMPLE PREPARATION FOR OIM-EBSD

A review of the preparation methods and techniques of electron backscatter diffraction (EBSD) samples

Reconstructing Oxide Profile of Eclogite Based on Logging Curves from the Main Hole of CCSD

Preparation Method of High Quality Cemented Carbide EBSD Sample by Mechanical Device

Application of EBSD Technique Combined with Back Scattered Electron Imaging in Material Science

The Electropolishing and Preparation Process of Titanium-alloy Metallographic Specimen for OIM Testing

Application of EBSD to analyzing low strain level microstructure

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Developments in microfabrication of mineral samples for simultaneous EBSD–EDS analysis utilizing an FIB–SEM instrument: study on an S–type cosmic spherule from Antarctica

EBSD Analysis Technology and Its Application in Iron and Steel

The Preparation Method of Metallographic Sample for Ti2AlNb Alloy

Processing and Interpretation of EBSD Data Gathered from Plastically Deformed Metals

Ultra-thin sections preparation of magnesium and its alloys

EBSD studies on historical relics analysis and ancient artifact manufacturing processes

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

Rapid Electron Backscatter Diffraction Mapping: Painting by Numbers