A New Measuring Method and Technology for Diamond Tool Edge Profile

孙涛,董申
DOI: https://doi.org/10.3969/j.issn.1005-2402.2002.08.018
2002-01-01
Abstract:s:AFM scanning measurement technology and atomic force micro-probe coordinate measurement technology for edge profile is studied. This new measuring technology can efficiently resolve the shortage of low accuracy of traditional measuring method in sub-micrometer level and is easy to operate, it offers a strong technical means for improving the grinding technology level of diamond tool in ultra-precision machining field.
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