Electro-Thermal Simulation of Integrated Circuits Using Finite Difference Method

王乃龙,刘淼,周润德
DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.020
2004-01-01
Abstract:A new electro-thermal simulator (ETsim2) for self-heat effect of integrated circuits is presented. For specific IC packages and special packaging materials, the simulator solves 3-D thermal diffusion equation by using the finite difference method (FDM). Substrate thermal distribution of IC chips is accurately estimated and their electrical performances are validated using this model.
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