One-dimensional Parallax-Free Position-Sensitive Detector for Diffraction Measurements Based on a Home-Made Thin THGEM.

Shi Chen,Hongbang Liu,Qian Liu,Yangheng Zheng,Binglong Wang,Wenqian Huang,Yang Dong,Yu Rong,Xinda Jiao,Yu Guan,Jing Wang,Min Li,Jizhou Liu,Mengmeng Zhang
DOI: https://doi.org/10.1107/s160057751801086x
IF: 2.557
2019-01-01
Journal of Synchrotron Radiation
Abstract:A large parallax-free gas diffraction meter based on a thinner-THGEM (thick gaseous electron multiplier) has been developed at the Beijing Synchrotron Radiation Facility (BSRF). A thinner-THGEM of thickness 200 µm is adopted, which can be shaped into a curve to eliminate parallax-error effects. The detector is designed to have a 48° open angle positioned 20 cm from the powder samples. A front-end electronics board with 128 channels direct-current mode was adapted for the 8 keV BSRF beamline with 0.2 ns/100 ns stable duty cycle. Two powder samples, TiO2 and SnO2, were tested separately. The measured spectra with an angular resolution of 0.148 ± 0.081° are consistent with the data from the powder diffraction file. Combining the gas gain of the thinner-THGEM with the electronic circuit dynamic range, a very broad dynamic range of about 107 could be obtained.
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