A 1-Gbps reference-less burst-mode CDR with embedded TDC in a 65-nm CMOS process.

Yuan Wang,Mengyin Jiang,Baoguang Liu,Song Jia,Xing Zhang
DOI: https://doi.org/10.1002/cta.2490
2018-01-01
Abstract:A reference-less all-digital burst-mode clock and data recovery circuit (CDR) is proposed in the paper. The burst-mode CDR includes a coarse and a fine time-to-digital converter (TDC) with embedded phase generator. A low-power current-starved inverter is employed as the delay unit of the fine TDC to acquire the high measurement resolution. A calibration method to diminish the inherent delay is used to reduce the quantization error of the recovery clock. The proposed CDR is fabricated in a 65-nm CMOS process. Experiment results show that the CDR operates from 0.9 to 1.1Gbps and have a 13-bit consecutive identical digits (CIDs) tolerance.
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