Abstract:Logic built-in self-test ( LBIST ) approaches use an on-chip logic block for test generation and thus enable in-field testing. Recent reports of silent data corruption underline the importance of in-field testing. In a class of storage-based LBIST approaches, compressed tests are stored on-chip and decompressed by an on-chip decompression logic. The on-chip storage requirements may become a bottleneck when the number of compressed tests is large. In this case, using each compressed test for applying several different tests allows the storage requirements to be reduced. However, producing different tests from each compressed test has a hardware overhead. This article suggests a new on-chip storage scheme for compressed tests that eliminates the additional hardware overhead. Under the new storage scheme, a set of N B -bit compressed tests targeting a set of faults F 0 is translated into a sequence S of N · B bits. Every B consecutive bits of S are considered as a compressed test. The sequence S thus yields close to N · B compressed tests, magnifying the test data stored in S almost B times. Taking advantage of the extra tests, the article describes a software procedure that is applied off-line to reduce S without losing fault coverage of F 0 . Experimental results for benchmark circuits demonstrate significant reductions in the storage requirements of S , and significant increases in the fault coverage of a second set of faults, F 1 .

Bit-Complemented Test Data to Replace the Tail of a Fault Coverage Curve

Reduced On-Chip Storage of Seeds for Built-In Test Generation

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure

Isolating Failure-Inducing Combinations in Combinatorial Testing Using Test Augmentation and Classification

Test Input Reduction for Result Inspection to Facilitate Fault Localization

On Full Path Delay Fault Testability of Combinational Circuits

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets

Conventional Tests for Approximate Scan Logic

Adaptive Combinatorial Testing

A survey of combinatorial testing

Test compaction for small-delay defects using an effective path selection scheme

Test data compression using extended frequency-directed run length code based on compatibility

2D Search Space for Extracting Broadside Tests from Functional Test Sequences

Sequential circuit ATPG using combinational algorithms

Reducing Test Sequence Length Using Invertible Sequences

A Case Study of Adaptive Combinatorial Testing