Reducing Test Sequence Length Using Invertible Sequences

Lihua Duan,Jessica Chen
DOI: https://doi.org/10.1007/978-3-540-76650-6_11
2007-01-01
Abstract:Conformance testing has been extensively studied in the context where the desired behavior of the implementation under test is modeled in terms of finite state machines. An essential issue in FSM-based conformance testing is to generate from a given finite state machine a test sequence that is both effective in detecting the faults in the implementation under test and efficient in terms of its length. In this paper, we consider test sequences satisfying the test criterion of the U-method as they have been proved to have high fault detectability. We present our solution to reduce the length of such a test sequence by maximizing the overlap among the test segments through the use of invertible sequences.
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