A Simple Method for Deriving I/O Constraints from Test Sequences

WJ Wu,JK Ho,CY Tang
DOI: https://doi.org/10.1109/icoin.1998.648475
1998-01-01
Abstract:I/O constraints are restrictions defined on the values of parameters of send or receive events in test sequences for test realization. I/O constraints generation is an important step when translating test sequences into abstract test suites. In this paper, a symbolic assignment substitution method is used to generate I/O constraints of test sequences derived from Extended Finite-State Machines (EFSM). The proposed method is simpler and combines the steps to determine feasibility of test sequence and to generate I/O constraints.
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