Investigation of Cr(SbTe) alloy for high-speed and high-data-retention phase change random access memory applications

Le Li,Sannian Song,Zhonghua Zhang,Zhitang Song,Yan Cheng,Shilong Lv,Liangcai Wu,Bo Liu,Songlin Feng
DOI: https://doi.org/10.1007/s00339-015-9211-3
2015-01-01
Applied Physics A
Abstract: The effects of Cr doping on the structural and electrical properties of Cr(SbTe) materials have been investigated in order to solve the contradiction between thermal stability and fast crystallization speed of SbTe alloys. Cr(SbTe) alloy is considered to be a potential candidate for phase change random access memory (PCM), as evidenced by a higher crystallization temperature (204 °C), a better data retention ability (137.6 °C for 10 years), a lower melting point (558 °C), a lower energy consumption, and a faster switching speed in comparison with those of GeSbTe. A reversible switching between set and reset states can be realized by an electric pulse as short as 5 ns for Cr(SbTe)-based PCM cell. In addition, Cr(SbTe) shows good endurance up to 1.1 × 10 cycles with a resistance ratio of about two orders of magnitude.
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