Benchmarking Tfet From A Circuit Level Perspective: Applications And Guideline

Lingyi Guo,Le Ye,Cheng Chen,Qianqian Huang,Libo Yang,Zhu Lv,Xia An,Ru Huang
DOI: https://doi.org/10.1109/ISCAS.2017.8051028
2017-01-01
Abstract:Low power applications have led to a boom in researches on new circuits based on steep-slope transistors, of which the objective is to overcome MOSFET's drawback of inevitable increasing leakage power while maintaining acceptable performance in low voltage operation. Among those emerging transistors, Tunnel FET (TFET) becomes a most promising one due to its low off current and compatibility with CMOS process. In order to guide the application and the improvement of TFET, in this paper from a circuit-level perspective, utilizing a newly defined benchmarking method, we figured out the frequency-V-DD range in which Si TFET circuits show low power advantage over their MOSFET counterparts based on HSPICE simulations using calibrated compact model. A systematic and quantitative analysis was then conducted to further enlarge the application scope of TFET circuits, with a Figure of Merit (FOM) and a guideline for future TFET proposed.
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