Abstract:The structure of an unconventional mesoporous material, formed by the packing of silica coated spherical micelles as hard spheres, has been uniquely determined through a series of advanced characterization techniques. The synchrotron-based small-angle X-ray scattering (SAXS) analysis confirms that the bulk material assembled via the hard sphere packing (HSP) route exhibits a strong 200 reflection and a relatively weaker 111 reflection, which is the first example in all reported mesostructured materials with the same symmetry. At the morphological macroscale, high-resolution scanning electron microscopy (SEM) images directly show that the hexagonal platelike micrometer-sized particles consist of nanospheres (similar to 20 nm in diameters) in a close packing mode. The intrinsic pore structure of calcined HSP material has been reconstructed using both electron crystallography (EC) and electron tomography (ET) techniques, which can be simply viewed as a face-centered cubic (fcc) packing of monodispersed hollow silica nanospheres. The EC technique provides a three-dimensional visualization of the pore organization and demonstrates the existence and crystallographic positions of the cagelike mesopores, octahedral and tetrahedral cavities. The ET method directly and accurately determines the sizes of the mesopores and octahedral cavity and offers nanometer-scale structural information at any given local area, which cannot be obtained by conventional transmission electron microscopy (TEM). To our knowledge, this is the first time that the EC and ET techniques are simultaneously employed and provide complementary information for the mesostructure determination. More importantly, the structural details collected from the synchrotron SAXS, high resolution SEM, EC and ET techniques are consistent and support the HSP mechanism, different from the well-understood liquid crystal templating or cooperative self-assembly pathways. The complex pore structure and the existence of octahedral and tetrahedral cavities are responsible for the unusual indexation of the SAXS, which is further validated by the structural simulation. Our work provides both a comparative and comprehensive case study to show the strength and limitation of individual techniques and demonstrates the need for the careful characterization of novel structures by a selection of complementary, state-of-the-art methods which provide selective structural information at different length scales.

Determination of Specific Surfaces of Silica Xerogets by SAXS

DETERMINATION OF AVERAGE PORE DIAMETER OF SiO2 XEROGELS BY SMALL ANGLE X-RA Y SCATTERING

Dependence of Silica Sol Properties on Synthesis Situation Studied by Saxs

SAXS investigations of the fractal character of additive silica xerogels

Study of Sol Structure by Saxs

Pore Structures of Methyl-Modified Silica Xerogels by Small Angle X-Ray Scattering

Porous Structure Characteristic of the Additive Silica Xerogels by SAXS

Extensive Inspection of an Unconventional Mesoporous Silica Material at All Length-Scales

Interface Layer in Colloid by Saxs

Comparing novel small-angle X-ray scattering approaches for absolute size and number concentration measurements of spherical SiO2 particles to established methods

SAXS investigation of silica aerogels derived from teos

Small Angle X-ray Scattering of Nanoporous Membranes: Effects of Geometry and Concentration

When Two Bad Data Sets Are Better Than One

X-Ray Standing Wave Enhanced Scattering from Mesoporous Silica Thin Films

Water Vapor Sorption on Surfactant-Templated Porous Silica Xerogels

Modelless X-Ray Scattering Study of a Silica Hydrosol Surface

An Investigation of Non-Fluorous Surfactant Dynol-604 Based Water-in-co2 Reverse Micelles by Small Angle X-ray Scattering

Detailed Characterization of Rough Surfaces for Silica Materials

Structural and textural evolution of dimethyl-modified silica xerogels

New Advances in the Application of Small-Angle X-ray Scattering

Solving Three-Dimensional Structures of Nano- and Intergrown Porous Silicates by Combining Electron Crystallography and Powder X-ray Diffraction