X‐ray beam diagnostics at the MID instrument of the European X‐ray Free‐Electron Laser Facility

Ulrike Boesenberg,Gabriele Ansaldi,Alexander Bartmann,Lewis Batchelor,Felix Brausse,Jörg Hallmann,Wonhyuk Jo,Chan Kim,Birthe Klein,Iker Lobato,Wei Lu,Johannes Möller,Ilia Petrov,Angel Rodriguez-Fernandez,Andreas Schmidt,Markus Scholz,Roman Shayduk,Konstantin Sukharnikov,Alexey Zozulya,Anders Madsen
DOI: https://doi.org/10.1107/s1600577524001279
IF: 2.557
2024-04-10
Journal of Synchrotron Radiation
Abstract:The multipurpose diagnostic end‐station (DES) at the Materials Imaging and Dynamics (MID) instrument at the European X‐ray Free‐Electron Laser Facility (EuXFEL) is described in detail and some exemplary beam diagnostic results are provided. Among other features, the DES is a key tool for alignment and the integrated bent‐diamond crystal spectrometer enables pulse‐resolved spectral characterization of the EuXFEL X‐ray beam.The Materials Imaging and Dynamics (MID) instrument at the European X‐ray Free‐Electron Laser Facility (EuXFEL) is equipped with a multipurpose diagnostic end‐station (DES) at the end of the instrument. The imager unit in DES is a key tool for aligning the beam to a standard trajectory and for adjusting optical elements such as focusing lenses or the split‐and‐delay line. Furthermore, the DES features a bent‐diamond‐crystal spectrometer to disperse the spectrum of the direct beam to a line detector. This enables pulse‐resolved characterization of the EuXFEL spectrum to provide X‐ray energy calibration, and the spectrometer is particularly useful in commissioning special modes of the accelerator. Together with diamond‐based intensity monitors, the imager and spectrometer form the DES unit which also contains a heavy‐duty beamstop at the end of the MID instrument. Here, we describe the setup in detail and provide exemplary beam diagnostic results.
optics,physics, applied,instruments & instrumentation
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