Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser

Sara J. Irvine,Kento Katagiri,Trygve M. Ræder,Ulrike Boesenberg,Darshan Chalise,Jade I. Stanton,Dayeeta Pal,Jörg Hallmann,Gabriele Ansaldi,Felix Brauße,Jon H. Eggert,Lichao Fang,Eric Folsom,Morten Haubro,Theodor S. Holstad,Anders Madsen,Johannes Möller,Martin M. Nielsen,Henning F. Poulsen,Jan-Etienne Pudell,Angel Rodriguez-Fernandez,Frank Schoofs,Frank Seiboth,Yifan Wang,Wonhyuk Jo,Mohamed Youssef,Alexey Zozulya,Kristoffer Haldrup,Leora E. Dresselhaus-Marais
2024-09-18
Abstract:Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-{\mu}m spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically-driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatially 3D and 2D axial-strain scans with sub-{\mu}m spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of microstructures.
Mesoscale and Nanoscale Physics,Materials Science
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