Effect of Oxygen-deficiencies on Resistance Switching in Amorphous YFe0.5Cr0.5O3−d Films

Xianjie Wang,Chang Hu,Yongli Song,Xiaofeng Zhao,Lingli Zhang,Zhe Lv,Yang Wang,Zhiguo Liu,Yi Wang,Yu Zhang,Yu Sui,Bo Song
DOI: https://doi.org/10.1038/srep30335
IF: 4.6
2016-01-01
Scientific Reports
Abstract:Herein, we demonstrate the contribution of the oxygen-deficiencies on the bipolar resistance switching (RS) properties of amorphous-YFe0.5Cr0.5O3−d (a-YFCO) films. The a-YFCO films were prepared under various oxygen pressures to tune the concentration of oxygen-deficiencies in the films. The XPS data verify that the oxygen-deficiencies increase with decreasing oxygen pressure. The RS property becomes more pronounced with more oxygen-deficiencies in a-YFCO films. Based on the Ohmic conduction measurements in the low resistance state, we confirm that the RS mechanism is related to the migration of oxygen-deficiencies. The enhanced RS and long retention in a-YFCO suggest a great potential for applications in nonvolatile memory devices.
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